cs.AR · 2026-07-23 · No. 62

Hardware Architecture, 2026-07-23.

3 new papers in cs.AR. Titles, authors, abstracts. Links to arXiv. Want this in your inbox every morning? Subscribe →

01 — The papers

3 entries
  1. 01

    Formal Foundations for Known Good Reliable Die Screening in Chiplet-Based AI Systems-on-Chip

    Prashanthi Metku, Chandra Gandu

    cs.AR · cs.AI

    The rapid growth of chiplet-based artificial intelligence systems-on-chip (SoCs) has exposed a fundamental gap in semiconductor test methodology. Existing Known Good Die (KGD) screening guarantees pre-assembly functional correctness, yet it offers no probabilistic assurance of post-assembly reliability lifetime. To address this limitation, the present work formalizes the transition from KGD to Known Good Reliable Die (KGRD) screening as a...

    arxiv.org/abs/2607.20141 · PDF

  2. 02

    Leveraging ECRAM for Edge Continual Learning

    Nabila Tasnim, Haoran Liu, Qing Cao, Saugata Ghose

    cs.AR · cs.ET · cs.LG

    Several edge computing platforms, such as autonomous vehicles and smart sensing devices, need to adapt to dynamic environments in real time by learning from new data in the field. Continual learning has emerged as a promising solution for edge training, by incorporating techniques that successfully combine a highly summarized version of previously trained data (to avoid catastrophic forgetting) with recently sensed data. However, as is the...

    arxiv.org/abs/2607.19661 · PDF

  3. 03

    From Bit-Position Sensitivity to Unequal Error Protection for DNN Inference Memory

    Muhammad Husnain Mubarik, Karthik Mohan Kumar, Pedro Antonio Pena, Keshavan Varadarajan, Kunal Tyagi

    cs.AR · cs.LG

    We characterize per-bit-position fault sensitivity in ML inference across 16 workloads -- spanning transformer-based models and attention-free CNNs -- and across three floating-point formats. Our central empirical finding is a sharp bit-sensitivity transition: flipping any of the least-significant fraction bits up to a data-type-specific threshold, Xsafe, degrades task metrics by less than 1% under deterministic single-bit stress tests....

    arxiv.org/abs/2607.19623 · PDF

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